IEC IEEE IEC61445 Edition 1.0 2012-06 INTERNATIONAL IEEE Std 1445TM STANDARD Digital Test Interchange Format (DTIF) IEC 61445:2012(E)IEEE Std 1445-1998 THIS PUBLICATIONIS COPYRIGHT PROTECTED Copyright1999IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Inc. Office. Any questions about IEEE copyright should be addressed to the IEEE. Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee. IEC Central Office Institute of Electrical and Electronics Engineers, Inc, 3, rue de Varembé 3 Park Avenue CH-1211 Geneva 20 NewYork,NY 10016-5997 Switzerland United States of America Tel.: +4122919 0211
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[email protected]. IEC >IEEE IEC 61445 Edition1.0 2012-06 INTERNATIONAL IEEE Std 1445TM STANDARD Digital Test InterchangeFormat (DTIF) INTERNATIONAL ELECTROTECHNICAL COMMISSION XD PRICE CODE ICS 25.040; 35.060 ISBN 978-2-83220-105-3 Warning! Make sure that you obtained this publication from an authorized distributor.
IEC 61445 2012 Digital Test Interchange Format (DTIF)
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