IEC IEEE IEC61671-2 Edition1.02016-04 INTERNATIONAL IEEE Std 1671.2T STANDARD Standardforautomatictest markuplanguage(ATML)instrument description IEC 61671-2:2016-04(en) IEEE Std 1671.2-2012 THISPUBLICATIONIS COPYRIGHTPROTECTED Copyright@2012JEEE All rights reserved. IEEE.is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics IEngineers, lnc. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office, Any questions about IEEE copyright should be addressed to the addressed to the IEC or your local IEC member National Committee. IEC Central Office Institute of Electrical and Eltectronics Engineers, Inc. 3, rue de Varembe 3 Park Avenue CH-1211 Geneva 20 New York, NY 10016-5997 Switzerland United States of America Tel.: +41 22 919 02 11 Bo aoaloqur sps Fax:+4122919 03 00 www.teee.drg Inw@woch www.ec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares arrd publishes International Standards.for allelectrical, electronic and related technologies, AboutIECpublications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEc Catalogue - webstore.iec chteatalogue Electropedia -www.electropedia-org Thestand-aloneapplication for conisulting the entire The world's leading online dictionary of electronic and bibliographical information on IEc International Standards, electrical ferms containing 20 000 terms and definitions in Technical Specifications, Technical Reports _and other English and French, with equivalent terms in, 15 additional documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical iPad. Vocabulary (IEV) online. IEC publications search -www.lec.chisearchpub IEc Glossary - std lec chtglossary The advanced search enables to find IEC publications by a variety. of criferia(reference number, text, technical French extracted from the Terms and Definitions clause of committee,..). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been and withdrawn publications. collected, from earlier publications of IEC TC 37, 77, 86 and CISPR. IEc Just Published - webstore.lec.chijustpublished Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstareiec.chtese. details all new publications released. Available online and If you wish to give us your feedback on this publication or also once a month by email. need further assistance, please contact the Customer Service Centre: ese@lec ch. IEC IEEE EC 61671-2 Edition 1.02016-04 INTERNATIONAL IEEE Std 1671.2TM STANDARD Standard for automatic test markuplanguage (ATML)instrument description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 IEC ISBN 978-2-8322-3265-1 IEEE ISBN 978-1-5044-0862-2 STD20900 Warning! Make sure that you obtained this publication from an authorized distributor. ? Registered trademark of the International ElectrQtechnical Commissiqn