IEC IEEE IEC 61671-2 Edition 1.02016-04 INTERNATIONAL IEEE Std 1671.2TM STANDARD Standard for automatic test markup language (ATML) instrument description EC 61671-2:2016-04(en) IEEE Std 1671.2-2012 THISPUBLICATIONISCOPYRIGHTPROTECTED Copyright @ 2012IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Inc. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office. Any questions about IEEE copyright should be addressed to the iEEE. Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee. IEC Central Office Institute of Electrical and Electronics Engineers, Inc. 3, rue de Varembé 3 Park Avenue CH-1211Geneva 20 NewYork, NY10016-5997 Switzerland United States of America Tel.: +41 22 919 02 11
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[email protected]. IEC >IEEE IEC 61671-2 Edition 1.02016-04 INTERNATIONAL IEEE Std 1671.2TM STANDARD Standard for automatic test markup language (ATML)instrument description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3265-1 Warning! Make sure that you obtained this publication from an authorized distributor. ? Regist